Neaspec neaSNOM Microscope

Neaspec neaSNOM Microscope

Optical Imaging & Spectroscopy meets AFM

Neaspec neaSNOM Microscope

Based on neaspec’s revolutionary technology, neaSNOM is the only microscope on the market capable of imaging & spectroscopy in the visible, infrared and even terahertz spectral region at 10 nm spatial resolution.

A large number of applications can be addressed with the neaSNOM microscope, including: nanoscale chemical identification of materials; analysis of functional nanostructures; and the characterization of photonic nanodevices or waveguide structures. This innovative product is based on a proprietary Atomic Force Microscope (AFM) core module designed for high-performance near-field measurements. It is complemented with a series of patented detection and illumination modules for reliable and reproducible (background-free) near-field microscopy and spectroscopy.

Key Features

Atomic Force Microscope (AFM) Specifications

Application Areas

In general, neaspec separates two main application directions:

nanoFTIR (Near-Field  Detection Module for Spectroscopy)

nanoFTIR (Near-Field Detection Module for Spectroscopy)

The neaSNOM can be equipped with optical imaging and/or optical spectroscopy.

The optical spectral region, in particular the "material fingerprint region in infrared," allows the investigation of a large variety of material properties. The patented technology brings this interesting long-wave spectral region to the nanoscale.

Nano-FTIR can be applied in many disciplines where high resolution chemical identification is required, such as chemistry, semiconductor technology, polymer science and life sciences. It only requires standard AFM sample preparation.

Key Features

For more information, including references and publications, visit

Neaspec neaSNOM Microscope Brochure